Analytical Capabilities

Soleras’ in-house analytical and materials characterization capabilities include the following:

ICP-OES (inductively coupled plasma optical emission spectrometry) to detect trace metals
Gas analysis for emission and process monitoring
SEM (scanning electron microscopy) with EDS (energy dispersive spectroscopy) for analysis of materials and surfaces
Metallography to determine physical structure and components of metals
Particle-size analysis
Density, hardness, surface and cross-sectional measurement
Phased array ultrasonic inspection
Magnetic flux mapping
CMM (coordinate measurement machine)
Vacuum helium leak detection
XRF (x-ray fluorescence)